Microscopy objectives
Innovation and precision for advanced experiments
At ASENSE, we design and manufacture customized microscope objectives for different scientific applications such as experiments in high vacuum environments, multispectral microscopy, laser writing and quantum dynamics, adapting to the specific needs of each experiment.
We offer both individual units and production batches according to the scale and requirements of each customer.
Some of our differential points:
- High resolution and transmission over a wide spectral range (from UV to NIR and SWIR).
- Compatibility with high vacuum environments using low outgassing materials.
- Non-magnetic materials such as ULTEM, for applications in quantum physics and manipulation of atoms.
- Long working distance and compensation for vacuum cell windows, facilitating integration into complex geometry experiments.
- Customisation of key parameters: numerical aperture (NA), focal length (EFL), field of view (FOV), transmission and optical quality.
Miniaturised design (<20 mm diameter, ≤50 mm length, ≤80 g weight)
NUV telecentric laser writing Microscope objetive
P/N 13717000
Parameters and values
Primary wavelength: 405nm
Secondary wavelength: 650 nm
Tertiary wavelength: 532nm
EFL: 3.6mm
NA: 0.5
Optical quality over FOV: 0.04λ @405nm
Telecentricity: 1mrad
Non-magnetic NIR Microscope objetives
Microscope objetive NIR NA07
P/N 09717000
Parameters and values
EFL: 12.5 mm
NA: 0.7
FOV: Φ200µm
Wavelength: 780, 795 & 850nm
Working distance: 17.06mm
Cover plate: SiO2 6.35mm
Transmission: ≥ 93% @1550nm ≥ 95% @775nm
Optical quality over FOV: ≤ 0.07 λ @1550nm
≤ 0.1 – 0.15 λ @775nm
Objective NIR NA04
P/N 09817000
Parameters and values
EFL: 15.0mm
NA: 0.4
FOV: Φ400µm
Wavelength: 780, 795 & 850nm
Working distance: 22.9mm
Cover plate: SiO2 6.35mm
Transmission: ≥ 93% @1550nm ≥ 80% @395nm
Optical quality over FOV: ≤ 0.2 λ @1550nm
≤ 0.25 λ @395nm
Microscope objetives for quantum dynamics
Microscope objetive F32
P/N 10517000
Parameters and values
EFL: 32 mm
f/n: f/1.5
FOV: Φ2º
Wavelength: 480 & 780nm
Working distance: 70mm
Cover plate: SiO2 10mm
Axial color: <6µm
Optical quality over FOV: ≤ 0.1 λ @480nm >
Objective F43
P/N 10417000
Parameters and values
EFL: 43mm
f/n: f/2.11
FOV: Φ2º
Wavelength: 780 & 1064nm
Working distance: 100mm
Cover plate: SiO2 6mm
Axial color: <6µm
Optical quality over FOV: ≤ 0.07 λ @780nm >
High-vacuum Microscope objetives
Objective
P/N 15917000
Parameters and values
Spectral waveband: 1550nm & 775nm
NA: 0.85
FOV: Φ100µm
EFL: 1.85mm
Axial color: < 5µm >
Transmission: > 93% @1550nm > 95% @775nm
Image quality: < 0.07 λ @1550nm < 0.1 – 0.15 λ @775nm
WD: 1.5mm
Objective
P/N 15917000
Parameters and values
Spectral waveband: 1550nm & 775nm
NA: 0.85
FOV: Φ100µm
EFL: 1.85mm
Axial color: < 5µm
Transmission: > 93% @1550nm > 95% @775nm
Image quality: < 0.07 λ @1550nm < 0.1 – 0.15 λ @775nm
WD: 1.5mm >
Multispectral lens VIS – NIR
P/N 18617000
Parameters and values
NA: 0.55
FOV: Φ200µm
EFL: 22.5mm
Transmission: > 90% @1064 – 480nm
Optical quality over FOV: < 0.25 λ @1064nm & 850nm
< 1 λ @795nm & 780nm
Cover plate: SiO2 6mm
Working distance: 31mm >
High transmission lens with image immersed in glass
P/N 15317000
Parameters and values
FOV: Φ200μm
EFL: 13mm
NA: 0.5
Wavelength: 1550nm & 1064nm
Optical quality over FOV: 0.1λ
Distortion: <0.01%
Cover plate: 6.35mm SiO2
Transmission: >98.5% @ 1550 & 1064 nm
Air to glass reflectivity: <0.1% >
Are you looking for a specific microscopy objective or do you need a tailor-made solution?
Contact us and find out how we can help you boost your research or industrial development.
Contact ASENSE
If you have any questions, you can contact us through this button
Phone
+ 34 937 37 98 63
sales@asensenova.com
Address
Carrer Cerdanya, 44
08820 El Prat de Llobregat
Barcelona
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